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High-Low Temperature Thermal Shock Test Chamber

Fixed Chambers, stored Hot/Cold Switching System.

Available to various Thermal Shock Test Standards !

In reliability tests conducted in various fields of advanced technology, including electronics, the importance of cold and hot shock tests which give harder hot and cold shocks than normal temperature tests, has been increasing.

KATO's THERMAL SHOCK CHAMBER has accurately grasped the trends in reliability tests in each field and has not only met the regular thermal shock test standards, but offers basic performance and expandability which can meet test specifications unique to each user.

As a basic configuration, chambers are fixed and a stored hot/cold switching system is used. In this system, a constant temperature chamber is installed at the upper part of the test chamber and a low-temperature chamber is installed at the lower part, the respective chamber are temperature controlled separately, and severe hot and cold shocks to the test chamber can be given by switching the damper instantaneously.

No physical stress is applied to test samples.
Data measurement of a long-term continuous test can be done though a cable hole.
Few mechanical problems because there is no sample drive unit.
The chambers are fixed and each chamber is designed to be highly airtight , thus solving frosting problems.

TSC series spec.

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E-mail: info@kato-inc.com